摘 要：全功能测试系统可测试动态瞬变值、时序、纹波和杂讯，以及波形抓取;支持负载和电源模块互换;全面优化的电源测试方案，适于快速测试程序开发和大批量的测试需求。
　　

参考文献
　　1 TPS2330, TPS2331 Single Hot-Swap Power Controllers With Circuit Breaker And Power-Good Reporting, http://focus.ti.com/lit/ds/symlink/tps2330.pdf
　　2 TPS2390, TPS2391 Simple -48-V Hot Swap Controller, http://focus.ti.com/lit/ds/symlink/tps2390.pdf
　　3 TPS2370 IEEE 802.3af Power Interface Switch for Power Over Ethernet (PoE) Powered Devices, http://focus.ti.com/lit/ds/symlink/tps2370.pdf
　　4 TPS2383 Octal Power Sourcing Equipment Power Manager, http://focus.ti.com/lit/ds/symlink/tps2383.pdf
　　 Basics on the TPS2370 Power-Over-Ethernet (PoE) Power Switch, http://focus.ti.com/lit/an/slva140/slva140.pdf
　　6 Comparing Performance of Current Ramp and Voltage Ramp Hot Swap Controller ICs, http://focus.ti.com/lit/an/slva103/slva103.pdf

作者简介
Heping Dai was born in Hubei, China. He received his B.S. and M.S. degrees in Electrical Engineering from Tsinghua University, China, in 1991 and 1995 respectively. He also got his M.S. in Electrical Engineering from the University of Texas, Dallas, in 2002, majoring in Microelectronics Circuits Design. From 1991 to 1993, he was a researcher with Tsinghua University and Hongshan Electrical Engineering Research Institute. From 1995 to 1997, he was a research assistant in Virginia Polytechnic Institute and State University, where he was engaged in the study of power converting techniques. Since 1998, he has been with Texas Instruments Inc., where he is involved in the development of power management integrated circuits (ICs).

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